In this article, the total time on test  (TTT) transformation and its major properties are investigated. Then, the relationship between the TTT transformation and some subjects in reliability theory is expressed. The TTT diagram is also drawn for some well-known lifetime distributions, and a real-data analysis is performed based on this diagram. A new distorted family of distributions is introduced using the distortion function. The statistical interpretation of the new life distribution from the perspective of reliability is provided, and its survival function is derived. Finally, a generalization of the Weibull distribution is introduced using a new distortion function. A real data analysis shows its superiority in fitting in comparison to the traditional Weibull model.