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Showing 2 results for Total Time on Test
Mojtaba Esfahani, Mohammad Amini, Gholamreza Mohtashami Borzadaran, Volume 15, Issue 1 (9-2021)
Abstract
In this article, the total time on test (TTT) transformation and its major properties are investigated. Then, the relationship between the TTT transformation and some subjects in reliability theory is expressed. The TTT diagram is also drawn for some well-known lifetime distributions, and a real-data analysis is performed based on this diagram. A new distorted family of distributions is introduced using the distortion function. The statistical interpretation of the new life distribution from the perspective of reliability is provided, and its survival function is derived. Finally, a generalization of the Weibull distribution is introduced using a new distortion function. A real data analysis shows its superiority in fitting in comparison to the traditional Weibull model.
Motahare Zaeamzadeh, Jafar Ahmadi, Bahareh Khatib Astaneh, Volume 15, Issue 2 (3-2022)
Abstract
In this paper, the lifetime model based on series systems with a random number of components from the family of power series distributions has been considered. First, some basic theoretical results have been obtained, which have been used to optimize the number of components in series systems. The average lifetime of the system, the cost function, and the total time on test have been used as an objective function in optimization. The issue has been investigated in detail when the lifetimes of system components have Weibull distribution, and the number of components has geometric, logarithmic, or zero-truncated Poisson distributions. The results have been given analytically and numerically. Finally, a real data set has been used to illustrate the obtained results.
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